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FIB4-200

Product Description:

42N/m, 320kHz, 10nm Tip Radius, 200nm-Wide-Spike @ 4µm

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Model Instrument Mount Pack Size Price Pack Quantity
FIB4-200 Vx & UVx - Automated AFM Unmounted 5 $1,000.00 (USD)


Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 320 230 410 42 20 80 125 110 140 40 30 50

Tip Specification

High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 20:1 at 4um from tip apex.
Geometry: High Aspect Ratio
Tip Height (h): 10 - 15µm
Front Angle (FA): 1.2 ± 0.5º
Back Angle (BA): 1.2 ± 0.5 º
Side Angle (SA): 1.2 ± 0.5 º
Tip Radius (Nom): 10 nm
Tip Radius (Max): 15 nm
Tip SetBack (TSB)(Nom): 15 µm
Tilt Compensation: 12º
Tip Set Back (TSB)(RNG): 5 - 25 µm
SpikeH(Rng): 4000 - 6000 nm
SpikeW: 200 nm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4 µm
Cantilever Thickness (RNG): 3.25 - 4.75 µm