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FESPW

Product Description:

***Note: Bruker has launched an improved FESPW-V2 probe and recommends customers transition to this new probe model.  

A wafer of Silicon Probes
Premium soft TappingMode and Force Modulation probes.  Unmounted for all AFMs.
Quantity=380
*Due to the inherent danger of mishandling or contamination during extraction of probes by non-Veeco personnel, we do not guarantee performance of wafers once opened at the consumers site.  Instead, we highly recommend buying in larger quantities of 10-packs to guarantee performance, taking advantage of bulk discount pricing.
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 75 50 100 2.8 1 5 225 200 250 28 23 33

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75 µm
Cantilever Thickness (RNG): 2.0 - 3.5 µm
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