Home → Product
Easy Product Wizard
kHz
N/m
Search Products Clear selection

DDESP-FM-10

Product Description:

***Note: Bruker has launched an improved DDESP-FM-V2 probe and recommends customers transition to this new probe model.  The legacy DDESP-FM-10 is no longer available for ordering.

The DDESP-FM-10 diamond probes have an electrically conductive doped diamond coating on the tip side.  This coating is extremely wearresistant due to the hardness of the diamond tip.  Typical applications for this probe include Scanning Spreading Resistance Microscopy (SSRM) ,Scanning Capacitance Microscopy (SCM), and Tunneling/Conducting AFM. 

Bruker also offers solid diamond probes with pyramidal tips forultra-high resolution in SSRM and other electrical modes.  Please see model SSRM-DIA.
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 105 80 130 6.2 3 11.4 225 250 200 28 23 33

Tip Specification

The Doped Diamond coating is used to harden the tip in applications that require both increased wear resistance and a conductive tip. The tradeoff for the increased lifetime is that the coating also increases the diameter of the tip. If a conductive coating is not needed, the DLC coated probes (Model# TESPD) provide a cost effective alternative.
Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 150 nm
Tip Radius (Max): 200 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm
Tip Coating: Conductive Diamond

Cantilever Specification

The aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. For general imaging, it is typically not necessary to have a reflective coating. Reflective coatings are recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01-0.02 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3 µm
Cantilever Thickness (RNG): 2.5µm - 3.5 µm
Front Side Coating: Conductive Diamond
Back Side Coating: Reflective Aluminum
Top Layer Front: 100 nm of Doped Diamond
Top Layer Back: 40 ± 10 nm of Al
Optional Product Offerings
DDESP-V2
Bruker DDESP-V2 Electrical Probes ***Note: Bruk...
Details | Shop
SCM-PTSI
Bruker SCM-PtSi Probes For the highest resoluti...
Details | Shop
DDESP-FM-V2
Bruker DDESP-FM-V2 Electrical ProbesProviding cons...
Details | Shop
SSRM-DIA
Pyramidal Solid Diamond Probes The IMEC diamond...
Details | Shop