FastScan Probes - for Air and Fluid

The Dimension FastScan™ Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. Based upon the highly successful Dimension Icon® AFM architecture, the FastScan AFM is a tip-scanning system that provides measurements on both large and small size samples in air or fluids. Now, with the Dimension FastScan Atomic Force Microscope system you can achieve in a single system, immediate atomic force microscopy images with the expected high resolution of a high-performance AFM. Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluids, the Dimension FastScan redefines the AFM experience.

Current probes available for FastScan AFM:

FastScan-A – Specifically engineered for fast scanning in air.  Specifications: k = 18 N/m, f = 1400 kHz, 100nm Al reflective coating

FastScan-B – Specifically engineered for fast scanning in liquid.  Specifications: k = 1.8 N/m, f = 450 kHz, 60nm Ti/Au reflective coating

FastScan-C – Softer cantilever than FastScan-B, also specifically engineered for fast scanning in liquid. Specifications: k = 0.8 N/m, f = 300 kHz, 60nm Ti/Au reflective coating

FastScan-D – Designed for optimal performance in fluid at high scan rates for AFM dynamics observations.  Specifications: k = 0.25 N/m, f = 110 kHz, Proprietary reflective coating

FastScan-D-SS – Super sharp probe for highest resolution imaging at high scan speeds.  Specifications: 1 nm Tip radius, k = 0.25 N/m, f = 110 kHz, Proprietary reflective coating

Click here for more information about the Dimension FastScan AFM.