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TESP-V2

TESP-V2
Geometry
Rectangular
Tip Radius (nm)
Nom: 7
Max: 10
Frequency (KHz)
Nom: 320
Min: 270
Max: 370
Length (µm)
Nom: 123
Min: 120
Max: 125
Spring Const (N/m)
Nom: 37
Min: 19
Max: 55
Width (µm)
Nom: 40
Min: 37
Max: 42
Order a free TESP-V2 sample
Price: $367.50 (USD)
Sold in packs of 10
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Questions? Free, Online Consulting
Overview

 

 

 

 

 

A pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's. 

Bruker AFM Probes has introduced an improved version of its popular, TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPA-V2.  
Tip Specification
TESP-V2 Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 17.5 ± 2.5ºº
Side Angle (SA): 20 ± 2.5ºº
Cantilever Specification
TESP-V2 Cantilever Image
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3µm
Cantilever Thickness (RNG): 2.8 - 3.8µm
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