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RMN-25PT400B
Geometry
RectangularFrequency (KHz)
Nom: 8
Min: 5
Max: 11
Length (µm)
Nom: 400
Min: 450
Max: 350
Spring Const (N/m)
Nom: 10
Min: 6
Max: 14
Width (µm)
Nom: 100
Min: 90
Max: 110
Order a free RMN-25PT400B sample
Price: $900.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
Solid Metal Probe, 8 N/m, 10 kHz
RockyMountain Nanotechnology (RMN) probes are uniquely constructed from pureplatinum and placed on a standard AFM probe sized ceramic substrate.Solid metal probes offer excellent conductivity and suffer no thin-filmadhesion problems that occur with metal-coated silicon probes. Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods. These probesare ideal for C-AFM, SCM, and KPFM/EFM applications. They are availablein a range of spring constants. Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm.
RockyMountain Nanotechnology (RMN) probes are uniquely constructed from pureplatinum and placed on a standard AFM probe sized ceramic substrate.Solid metal probes offer excellent conductivity and suffer no thin-filmadhesion problems that occur with metal-coated silicon probes. Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods. These probesare ideal for C-AFM, SCM, and KPFM/EFM applications. They are availablein a range of spring constants. Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm.
Tip Specification
Tip Height (h): ~100 µm
Cantilever Specification
Material: Solid Platinum
Geometry: Rectangular
Cantilevers Number: 1