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Electrostatic Force Microscopy (EFM)
Electrostatic Force Microscopy (EFM) uses a combination of TappingMode™, LiftMode™and a conductive afm tip to provide information pertaining to the electric field above a conductive sample. Each sample line is scanned using TappingMode to obtain topography data first. This topographic information is stored and retraced with a height offset in LiftMode, and the electrical data is then collected.
Piezoresponse/ Piezoforce Microscopy (PFM)
Piezoforce Microscopy (PFM) is a technique based on contact mode. PFM identifies the inverse piezoelectric effect of a sample by electrically stimulating the sample so the topographic response of the sample can be monitored by lock-in techniques. Amplitude and phase information show details such as the strength and direction of the polarization on the sample.
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Electrochemical Potential Microscopy (SECPM) us a sharp needle as the afm probe. Detector signal is the electric potential difference between the AFM tip and sample (or between afm tip and a reference electrode) in an ionic or polar liquid, where an electric double-layer exists at the liquid/sample interface. SECPM charts the electric potential profile across the depth of the double-layer (versus Z, the tip-sample distance) at tip XY location. In feedback mode, the output signal adjusts the Z position of the scanner.
Scanning Spreading Resistance Mode (SSRM)
Scanning Spreading Resistance Mode (SSRM) is a technique based on contact mode that is is frequently used to map the variation in majority carrier concentration in doped semiconductors. Sensor Signal is the electric current between the conductive tip and sample for an applied DC bias, VDC.  Using a logarithmic amplifier, SSRM measures the current by referencing it to an internal resistor, thereby yielding a local resistance value.
Scanning Tunneling Microscopy (STM)
STM, which uses a metal needle as the afm tip, is one of the highest resolution AFM techniques. When an electrical bias, V, is applied, the detector signal is the tunneling current between the afm tip and sample . In feedback mode, output signal adjusts the Z position of the scanner to maintain a tunneling current setpoint.
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