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VTESPA-300

Product Description:

Visible Apex Probe with highest performance and consistency.
- 40 N/m, 300 kHz
- Aluminum Reflex Coating
- 10 pack
- Also available as wafer model VTESPA-300-W

Bruker's New VTESPA-300 combines the advantage of a visible apex tip for feature targeting with the best measurement consistency and highest performance for TappingMode imaging.  It covers a wide range of TappingMode imaging applications and is ideal for roughness measurements, imaging IC devices, thin films, and crystal surfaces.  Key features of the probe include:

1) Visible apex tip enables AFM imaging exactly at the location targeting through the AFM optics.

2) Attains the highest consistency in AFM measurements due to industry best probe-to-probe consistency in tip radius, tip height, spring constant, and tapping frequency.

3) Designed and optimized by Bruker, the inventor of TappingMode, to achieve the highest performance TappingMode imaging.

4) Produces accurate images of rugged features, enabled by the narrow tip angle and forward pointing tip design that effectively compensates for the forward tilt of the AFM probe holder (typically 5-20 degrees).

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
VTESPA-300 All Unmounted 10 $340.00 (USD)

Quantity discounts available

QtyPrice/Pack
2-6$289.00 (USD)
7-15$255.00 (USD)
16-24$221.00 (USD)
25-37$187.00 (USD)
38+$153.00 (USD)



Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 300 225 375 42 25 65 150 140 160 40 38 42

Tip Specification

Geometry: Visible Apex
Tip Height (h): 9.0 - 12µm
Front Angle (FA): 0 ± 2º
Back Angle (BA): 54 ± 2 º
Side Angle (SA): 30 ± 2 º
Tip Radius (Nom): 7 nm
Tip Radius (Max): 10 nm
Tip SetBack (TSB)(Nom): 0 µm

Cantilever Specification

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4.4 µm
Cantilever Thickness (RNG): 3.9 - 4.9 µm
Back Side Coating: Reflective Al
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