Super Sharp Conductive Single Crystal Diamond Probes, 2.8 N/m, 65 kHz, <5 nm ROC, 5-Pack
Super sharp tip for highest resolution combined with intermediate spring constant for applications including:
- Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
- Electrical characterization with PeakForce TUNA, TUNA, CAFM.
- Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.
