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AD-2.8-AS

Product Description:

Sharp Conductive Single Crystal Diamond Probes, 2.8 N/m, 65 kHz, 10 nm ROC, 5-Pack

Intermediate spring constant for applications including:

- Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
- Electrical characterization with PeakForce TUNA, TUNA, CAFM.
- Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.


Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
AD-2.8-AS All Unmounted 5 $1,000.00 (USD)


Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 65 50 100 2.8 1.0 6.0 225 215 235 35 30 40

Tip Specification

Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm·cm. Contact resistance is typically 10 kOhm depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.
Geometry: Standard
Tip Height (h): 12.5 ± 2.5µm
Front Angle (FA): 25 ± 5º
Back Angle (BA): 15 ± 5 º
Side Angle (SA): 22.5 ± 5 º
Tip Radius (Nom): 10 ± 5 nm
Tilt Compensation: 0 ± 1º
Tip Set Back (TSB)(RNG): 15 - 25 µm
SpikeH(Rng): 300 ± 100 nm
Tip Coating: Highly conductive single crystal diamond

Cantilever Specification

Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.5 µm
Cantilever Thickness (RNG): 1.0 - 2.0 µm
Back Side Coating: Reflective Au
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