*20% Wafer discount in effect*
A wafer of High quality long-lever etched silicon probes for TappingMode™ and other
non-contact modes. Unmounted for use on standard AFM's.
Bruker AFM Probes has introduced an improved version of its popular,
LTESP/LTESPA AFM probes. Bruker’s new line of LTESP high quality premium
etched silicon probes set the industry standard for long-lever TappingMode™ and
non-contact mode in air.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model
LTESPW-V2.
The current model
LTESPW is available for ordering through early 2014 at which point, it will become obsolete.