Olympus OMCL-AC240TM-R3
OSCM-PT-R3 series probes have
platinum-deposited cantilevers that aresuitable for conducting scanning probe microscopy in air usingelectric force microscopy (EFM) or Kelvin probe force microscopy (KFM) modes, with an unprecedented sharpness of
15nm radius as a metal coated probe.
These probes feature:
1) High electrical conductivity:
The platinum-deposited probe shows lower conductivity in one and a halforders of magnitude than that of highly doped silicon probes. Its probe resistanceof 350 ohms is sufficiently low for electric measurements required highelectro-potential resolution. The surfaces of precious metal coatingsare free from oxidization and are electrically stable.
2) High resolution:
The apex of 15 nm (typ.) radius is prominently sharp among metal-coated probes (see the tip apex). The thin and sharp tetrahedral probe reveals sample surface precisely both in electrically and in topographically.
3) Visible apex tip:
OSCM-PT-R3 has a tetrahedral tip on the exact end of thecantilever. Since the tip isn't hidden by the body of cantilever, it canbe positioned exactly at a point of interest using an opticalmicroscopy.
The current model OSCM-PT is available for ordering through early 2014 at which point, it will become obsolete.