Sample

Application

Mode

AFM

Resonant Frequency:

kHz

Spring Constant:

N/m

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SCANASYST-AIR-HPI

New ScanAsyst and PeakForce Tapping probes designed for applications in a high-volume environment on

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FMV-PT

Product Description:

A pack of Conductive Silicon Probes.

Bruker's Value Line Probe for Electrical Characterization with soft TappingMode™ or other "AC/non-contact modes."

Specifications:
- Tip radius of 25 nm nominal.
- Platinum-Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications.
-The Pt-Ir coating on the front side of the cantilever provides ametallic electrical path from the cantilever die to the apex of the tip.
- The coating on the back side of the cantilever enhances laser reflectivity.
- Unmounted for all AFMs.

Add To Cart

Model	Instrument	Mount	Pack Size	Price	Pack Quantity
FMV-PT	All	Unmounted	10	$210.00 (USD)

Quantity discounts available

Qty	Price/Pack
1-2	$210.00 (USD)
3+	$160.00 (USD)

Shape	Resonant Freq. kHz			Spring Const. N/m			Length µm			Width µm
Shape	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.
Rectangular	75	50	100	2.8	1	5	225	250	200	28	23	33

Tip Specification

Tip Schematic

Geometry:	Standard (Steep)
Tip Height (h):	10 - 15µm
Front Angle (FA):	25 ± 2.5ºº
Back Angle (BA):	15 ± 2.5º º
Side Angle (SA):	22.5 ± 2.5º º
Tip Radius (Nom):	25 nm
Tip SetBack (TSB)(Nom):	15 µm
Tip Set Back (TSB)(RNG):	5-25 µm

Cantilever Specification

Cantilever schematic

Material:	0.01 - 0.025 Ocm Antimony (n) doped Si
Geometry:	Rectangular
Cantilevers Number:	1
Cantilever Thickness (Nom):	2.75 µm
Cantilever Thickness (RNG):	2.0 - 3.5 µm
Front Side Coating:	Conductive PtIr
Back Side Coating:	Reflective PtIr