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EBD-CDR50

Product Description:

The EBD-CDR probes for 3D reference and hybrid metrology: with a full range of EBD-CDR probes from 130 nm down to 15 nm, this is pushing the limits of 3D-AFM technology for measuring tight dimensions and extending its capability for future nodes. It brings EBD´s key strength: precise tip orientation, precise control in tip dimensions (length, total diameter, vertical edge height, overhang) and large volume production to undercut applications. These tips do not have a wear resistance coating - but made from bulk wear resistance diamond like carbon.

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Model Instrument Mount Pack Size Price Pack Quantity
EBD-CDR50 Insight Unmounted 5 $3,000.00 (USD)
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 300 200 400 40 20 80 125 115 135 35 30 40

Tip Specification

50 nm full carbon CD probe. Low vertical edge height, constant edge radius maintains resolution over tip life.
Geometry: Critical Dimension (Overhang)
Tip Height (h): 10 - 15µm
Tip Radius (Max): <10nm
Tip SetBack (TSB)(Nom): 15µm
Tilt Compensation: 3º
Tip Set Back (TSB)(RNG): 5 - 25µm
Overhang: 5 - 10nm
Effective Length: 200 - 250nm
Tip Dia.(nm): 45 - 55nm
Vertical Edge Height(nm): <15nm

Cantilever Specification

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilever Thickness (Nom): 3.75µm
Cantilever Thickness (RNG): 3.0-4.5µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 40 ± 10 nm of Al
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