Sample

Application

Mode

AFM

Resonant Frequency:

kHz

Spring Constant:

N/m

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FASTSCAN-C

FastScan-C probes are designed specifically for imaging in fluid on the Dimension FastScan AFM.&nbs

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FASTSCAN-A

Product Description:

FastScan-A probes are designed specifically for imaging in air on the Dimension FastScan AFM. They deliver extreme imaging speed without loss of resolution, loss of force control, or added complexity.

With the ability to perform 20x to 100x faster scans, these probes provide users with more high-quality data at a considerably faster rate, with little added operational cost.

The FastScan-A cantilevers utilize a novel 27 um long triangular Silicon Nitride cantilever to achieve a 1400 kHz resonant frequency with only a 17 N/m force constant. The Silicon tip has an extremely sharp 5 nm tip radius, making it ideal for imaging a wide variety of hard and soft materials.

All FastScan cantilevers have less that 3 degrees of cantilever bend. Using this probe on an AFM other than the Dimension FastScan is not recommended and will result in sub-optimal performance.

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Model	Instrument	Mount	Pack Size	Price	Pack Quantity
FASTSCAN-A	Dimension FastScan™	Unmounted	10	****

Shape	Resonant Freq. kHz			Spring Const. N/m			Length µm			Width µm
Shape	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.
Triangular	1400	800	2000	18	10	25	27	24	30	33	30	36

Tip Specification

Geometry:	Rotated (Symmetric)
Tip Height (h):	2.5 - 8µm
Front Angle (FA):	15 ± 2.5º
Back Angle (BA):	25 ± 2.5º
Side Angle (SA):	17.5º
Tip Radius (Nom):	5nm
Tip Radius (Max):	12nm
Tip SetBack (TSB)(Nom):	5µm
Tip Set Back (TSB)(RNG):	0 - 7µm

Cantilever Specification

Material:	Silicon Nitride
Geometry:	Triangular
Cantilevers Number:	1
Cantilever Thickness (Nom):	0.6µm
Cantilever Thickness (RNG):	0.55 - 0.65µm
Back Side Coating:	Reflective Aluminum
Top Layer Back:	100 ± 10 nm of Al