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Pyramidal Solid Diamond Probes The IMEC diamond AFM tips are made from solid boron-doped polycrys
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MPP-23120-10

Product Description:

Multi190: 35N/m, 190kHz, Rotated Tip, Aluminum Reflective Coating

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Model Instrument Mount Pack Size Price Pack Quantity
MPP-23120-10 All Unmounted 10 $385.00 (USD)

Quantity discounts available

QtyPrice/Pack
2-6$327.25 (USD)
7-15$288.75 (USD)
16-24$250.25 (USD)
25-37$211.75 (USD)
38+$173.25 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 190 150 230 35 17.5 70 225 235 215 40 35 45

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Schematic
Geometry: Rotated (Symmetric)
Tip Height (h): 15 - 20µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2º
Side Angle (SA): 17.5 ± 2º
Tip Radius (Nom): 8nm
Tip Radius (Max): 12nm
Tip SetBack (TSB)(Nom): 15µm
Tip Set Back (TSB)(RNG): 5 - 25µm

Cantilever Specification

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating are recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Cantilever schematic
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 6.25µm
Cantilever Thickness (RNG): 5.50 - 7.00µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 40 ± 10 nm of Al