My Account
|
|
Login
go
Home
Probes
Shop by Mode
Conductive AFM (CAFM)
Contact Mode
Critical Dimension (CD) AFM
Deep Trench (DT)
Electrical Spectroscopy
Electrostatic Force Microscopy (EFM)
Fast Scan
Force Modulation
Force Spectroscopy
HarmoniX
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
NanoIndentation
Nanoscale Thermal Analysis
PeakForce QNM
PeakForce Tapping
PeakForce TUNA
Piezoresponse/ Piezoforce Microscopy (PFM)
ScanAsyst
Scanning Capacitance Mode (SCM)
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Spreading Resistance Mode (SSRM)
Scanning Tunneling Microscopy (STM)
Surface Potential Microscopy (SPoM)
TappingMode/ Non-Contact
Torsional Resonance (TR)
Tunneling AFM (TUNA)
Shop by Application
Electrical
Electrochemistry
Fluid Imaging
General Topography
Holes/ Trenches
Mechanical Force Curves
Mechanical Property Mapping
Pulling
Ultra Hi-Res
Shop by AFM
BioScope
BioScope Catalyst
Caliber
Dimension (Other)
Dimension FastScan
Dimension Icon
EnviroScope
Innova
Insight
MultiMode
NEOS/ Senterra
Non-Bruker AFM
Vx and UVx
Shop by Sample
Bio Molecules
Cells
Ceramics
Data Storage
Other Hard Samples
Other Soft Sample
Polymers
Semiconductors
AFM Accessories
Shop by AFM
BioScope Catalyst
Bioscope®
Caliber™
Dimension
EnviroScope™
For All AFMs
Innova™
MultiMode®
Shop by Accessory Type
Alignment Stands
Calibration References
Calibration Standards
Condensation Windows
Evaporation Covers
Fluid Cell Kits
Fluid Cells
MFM Tool Kits
Mounting Kits
O-Rings
Petri Dish Clamps
Piezo Guards
Probe Holders
Probe Storage Kits
Replacement Springs
Sample Holders
Splash Guards
Starter Kits
Test Samples
AFM Systems
Upgrades by AFM
BioScope Catalyst Upgrades
Dimension Edge Upgrades
Dimension FastScan Upgrades
Dimension Icon Upgrades
Innova Upgrades
MultiMode Upgrades
Trade-Ins by AFM
BioScope/SZ/II Trade-Ins
D3000/D3100/D5000 Trade-Ins
EnviroScope Trade-Ins
Quote Request
Events
Support
AFM Probe FAQs
Bruker site
NanoScale World
Applications Selector Guide
About Bruker AFM Probes
Contact
Shopping Cart (0)
Home
→ Product
Easy Product
Wizard
Sample
Bio Molecules
Cells
Ceramics
Data Storage
Other Hard Samples
Other Soft Sample
Polymers
Semiconductors
Application
Holes/ Trenches
Electrical
Electrochemistry
Fluid Imaging
Mechanical Force Curves
Mechanical Property Mapping
Pulling
General Topography
Ultra Hi-Res
Mode
Conductive AFM (CAFM)
Contact Mode
Critical Dimension (CD) AFM
Electrical Spectroscopy
Electrostatic Force Microscopy (EFM)
Fast Scan
Force Modulation
Force Spectroscopy
HarmoniX
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
NanoIndentation
TappingMode/ Non-Contact
PeakForce QNM
PeakForce Tapping
PeakForce TUNA
Piezoresponse/ Piezoforce Microscopy (PFM)
ScanAsyst
Scanning Capacitance Mode (SCM)
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Spreading Resistance Mode (SSRM)
Nanoscale Thermal Analysis
Scanning Tunneling Microscopy (STM)
Surface Potential Microscopy (SPoM)
Torsional Resonance (TR)
Tunneling AFM (TUNA)
Deep Trench (DT)
AFM
BioScope
BioScope Catalyst
Caliber
Dimension (Other)
Dimension Icon
Dimension FastScan
EnviroScope
Innova
Insight
MultiMode
NEOS/ Senterra
Non-Bruker AFM
Vx and UVx
Resonant Frequency:
kHz
± 50kHz
± 100kHz
± 200kHz
Spring Constant:
N/m
± 5 N/m
± 10 N/m
± 15 N/m
Search Products
Clear selection
Featured Products
FASTSCAN-B
FastScan-B probes are designed specifically for imaging in fluid on the Dimension FastScan AFM.&nbs
Details | Shop
HMXS-10
Product Description:
A pack of HarmoniX Probes
"Soft" version for nanoscale material property mapping of softer samples in the 0.5MPa to 1GPa hardness range. HMXS are significantly softer (about 5x) than HMX but with similar bandwidth. This makes HMXS better for:
+ Adhesion measurements where background noise can dominate. These probes are about 5x more sensitive (background noise levels of a few hundred pN).
+ High resolution on softer materials where peak forces must be small to control sample deformation
+ Stiffness measurements on softer materials.
HMX probes are better for stiffer samples and sticky samples where the tip can get stuck to the surface. Unmounted for HamorniX-enabled, NS5-based AFMs.
Quantity=10
Add To Cart
Model
Mount
Pack Size
Price
Pack Quantity
HMXS-10
Unmounted
10
****
Shape
Resonant Freq.
kHz
Spring Const.
N/m
Length
µm
Width
µm
Nom.
Min.
Max.
Nom.
Min.
Max.
Nom.
Min.
Max.
Nom.
Min.
Max.
Rectangular
40
25
55
1
0.3
2
300
290
310
25
20
30
Tip Specification
These probes are the characteristic "off-axis" design specific to the Veeco HarmoniX mode. The torsional/flexural spring constant is 17N/m.
Tip Schematic
Geometry:
Rotated (Symmetric)
Tip Height (h):
4 - 10
µm
Front Angle (FA):
25 ± 2.5
º
Back Angle (BA):
15 ± 2.5
º
Side Angle (SA):
22.5 ± 2.5
º
Tip Radius (Nom):
10
nm
Tip Radius (Max):
12
nm
Tip SetBack (TSB)(Nom):
10
µm
Tip Set Back (TSB)(RNG):
5 - 15
µm
Cantilever Specification
Aluminum reflective coating on the backside of the cantilever is standard. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material:
0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry:
Rectangular
Cantilevers Number:
1
Cantilever Thickness (Nom):
3
µm
Cantilever Thickness (RNG):
2.0 - 3.5
µm
Back Side Coating:
Reflective Aluminum
Top Layer Back:
40 ± 10 nm of Al
Optional Product Offerings
HMXS-W
A wafer of HarmoniX Probes"Soft" version for nanos...
Details | Shop
HMX-10
A pack of HarmoniX Probes For nanoscale material ...
Details | Shop
HMX-W
A wafer of HarmoniX ProbesFor nanoscale material p...
Details | Shop