Bruker's Microlever AFM probes have soft Silicon Nitride cantilevers with Silicon Nitride tips, and are ideal for contact imaging modes, force modulation microscopy, and liquid operation. The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy.
Each unmounted probe comes with six different cantilevers of various dimensions, resulting in six unique nominal values for force constant and resonant frequency. The MLCT cantilever layout consists of an "A" cantilevers on one side of the probe, and "B," "C," "D," "E," and "F"
cantilevers on the other side of the probe. See the cantilever orientation diagram here.
All cantilevers on the Microlever probes have less than 2 degrees of cantilever bend.
For a probe with considerably sharper Silicon tips on the same cantilever layout, please see model MSNL-10