My Account
|
|
Login
Probes
Accessories
+1 (800) 715-8440
Home
Probes
Shop by Mode
Conductive AFM (CAFM)
Contact Mode
Critical Dimension (CD) AFM
Deep Trench (DT)
Electrical Spectroscopy
Electrostatic Force Microscopy (EFM)
Fast Scan
Force Modulation
Force Spectroscopy
HarmoniX
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
NanoIndentation
Nanoscale Thermal Analysis
PeakForce QNM
PeakForce Tapping
PeakForce TUNA
Piezoresponse/ Piezoforce Microscopy (PFM)
ScanAsyst
Scanning Capacitance Mode (SCM)
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Spreading Resistance Mode (SSRM)
Scanning Tunneling Microscopy (STM)
Surface Potential Microscopy (SPoM)
TappingMode/ Non-Contact
Torsional Resonance (TR)
Tunneling AFM (TUNA)
Shop by Application
Electrical
Electrochemistry
Fluid Imaging
General Topography
Holes/ Trenches
Mechanical Force Curves
Mechanical Property Mapping
Pulling
Ultra Hi-Res
Shop by AFM
BioScope
BioScope Catalyst
Caliber
Dimension (Other)
Dimension FastScan
Dimension Icon
EnviroScope
Innova
Insight
MultiMode
NEOS/ Senterra
Non-Bruker AFM
Vx and UVx
Shop by Sample
Bio Molecules
Cells
Ceramics
Data Storage
Other Hard Samples
Other Soft Sample
Polymers
Semiconductors
AFM Accessories
Shop by AFM
BioScope Catalyst
Bioscope®
Caliber™
Dimension
EnviroScope™
For All AFMs
Innova™
MultiMode®
Shop by Accessory Type
Alignment Stands
Calibration References
Calibration Standards
Condensation Windows
Evaporation Covers
Fluid Cell Kits
Fluid Cells
MFM Tool Kits
Mounting Kits
O-Rings
Petri Dish Clamps
Piezo Guards
Probe Holders
Probe Storage Kits
Replacement Springs
Sample Holders
Splash Guards
Starter Kits
Test Samples
AFM Systems
Upgrades by AFM
BioScope Catalyst Upgrades
Dimension Edge Upgrades
Dimension FastScan Upgrades
Dimension Icon Upgrades
Innova Upgrades
MultiMode Upgrades
Trade-Ins by AFM
BioScope/SZ/II Trade-Ins
D3000/D3100/D5000 Trade-Ins
EnviroScope Trade-Ins
Quote Request
Events
Support
AFM Probe FAQs
Bruker site
NanoScale World
Applications Selector Guide
About Bruker AFM Probes
Contact
Shopping Cart (0)
Home
→ Product
Easy Product
Wizard
Sample
Bio Molecules
Cells
Ceramics
Data Storage
Other Hard Samples
Other Soft Sample
Polymers
Semiconductors
Application
Holes/ Trenches
Electrical
Electrochemistry
Fluid Imaging
Mechanical Force Curves
Mechanical Property Mapping
Pulling
General Topography
Ultra Hi-Res
Mode
Conductive AFM (CAFM)
Contact Mode
Critical Dimension (CD) AFM
Electrical Spectroscopy
Electrostatic Force Microscopy (EFM)
Fast Scan
Force Modulation
Force Spectroscopy
HarmoniX
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
NanoIndentation
TappingMode/ Non-Contact
PeakForce QNM
PeakForce Tapping
PeakForce TUNA
Piezoresponse/ Piezoforce Microscopy (PFM)
ScanAsyst
Scanning Capacitance Mode (SCM)
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Spreading Resistance Mode (SSRM)
Nanoscale Thermal Analysis
Scanning Tunneling Microscopy (STM)
Surface Potential Microscopy (SPoM)
Torsional Resonance (TR)
Tunneling AFM (TUNA)
Deep Trench (DT)
AFM
BioScope
BioScope Catalyst
Caliber
Dimension (Other)
Dimension Icon
Dimension FastScan
EnviroScope
Innova
Insight
MultiMode
NEOS/ Senterra
Non-Bruker AFM
Vx and UVx
Resonant Frequency:
kHz
± 50kHz
± 100kHz
± 200kHz
Spring Constant:
N/m
± 5 N/m
± 10 N/m
± 15 N/m
Search Products
Clear selection
Featured Products
FASTSCAN-B
FastScan-B probes are designed specifically for imaging in fluid on the Dimension FastScan AFM.&nbs
Details | Shop
NP-10UC
Product Description:
4 Cantilevers 0.06-0.35N/m; No Coatings
Note: Uncoated probes cannot be used for imaging or force measurements without a reflective coating added by the user.
Add To Cart
Model
Instrument
Mount
Pack Size
Price
Pack Quantity
NP-10UC
All
Unmounted
10
$240.00 (USD)
Quantity discounts available
Qty
Price/Pack
2-6
$204.00 (USD)
7-15
$180.00 (USD)
16-24
$156.00 (USD)
25-37
$132.00 (USD)
38+
$120.00 (USD)
Shape
Resonant Freq.
kHz
Spring Const.
N/m
Length
µm
Width
µm
Nom.
Min.
Max.
Nom.
Min.
Max.
Nom.
Min.
Max.
Nom.
Min.
Max.
A Triangular
65
50
80
0.35
0.175
0.7
120
125
115
25
20
30
B Triangular
23
16
28
0.12
0.06
0.24
205
200
210
40
35
45
C Triangular
56
40
75
0.24
0.12
0.48
120
115
125
20
15
25
D Triangular
18
12
24
0.06
0.03
0.12
205
200
210
25
20
30
Tip Specification
Tip Schematic
Geometry:
Rotated (Symmetric)
Tip Height (h):
2.5 - 8.0
µm
Front Angle (FA):
15 ± 2.5
º
Back Angle (BA):
25 ± 2.5
º
Side Angle (SA):
17.5 ± 2.5
º
Tip Radius (Nom):
20
nm
Tip Radius (Max):
60
nm
Tip SetBack (TSB)(Nom):
4
µm
Tip Set Back (TSB)(RNG):
0 - 7
µm
Cantilever Specification
Cantilever Orientation diagram can be found here.
No reflective coating
Cantilever schematic
Material:
Silicon Nitride
Geometry:
Triangular
Cantilevers Number:
4
Cantilever Thickness (Nom):
0.6
µm
Cantilever Thickness (RNG):
0.55 - 0.65
µm
Optional Product Offerings
NP-10
A 10-pack of silicon nitride probes for contact an...
Details | Shop
NP-W-UC
4 Cantilevers 0.06-0.35N/m; No CoatingsNote: Uncoa...
Details | Shop