My Account
|
|
Login
go
+1 (800) 715-8440
Home
Probes
Shop by Mode
Conductive AFM (CAFM)
Contact Mode
Contact Resonance
Critical Dimension (CD) AFM
Deep Trench (DT)
Electrical Spectroscopy
Electrostatic Force Microscopy (EFM)
Fast Scan
FASTForce Volume
Force Modulation
Force Spectroscopy
HarmoniX
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
NanoIndentation
Nanoscale Thermal Analysis
PeakForce QNM
PeakForce Tapping
PeakForce TUNA
Piezoresponse/ Piezoforce Microscopy (PFM)
ScanAsyst
Scanning Capacitance Mode (SCM)
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Spreading Resistance Mode (SSRM)
Scanning Tunneling Microscopy (STM)
Surface Potential Microscopy (SPoM)
TappingMode/ Non-Contact
Tip Enhanced Raman Spectroscopy (TERS)
Torsional Resonance (TR)
Tunneling AFM (TUNA)
Shop by Application
Electrical
Electrochemistry
Fluid Imaging
General Topography
Holes/ Trenches
Mechanical Force Curves
Mechanical Property Mapping
Pulling
Ultra Hi-Res
Shop by AFM
BioScope
Insight
MultiMode
NEOS/ Senterra
Non-Bruker AFM
Vx and UVx
BioScope Catalyst
BioScope Resolve
Caliber
Dimension FastScan
Dimension Icon
Dimension (Other)
EnviroScope
Innova
Shop by Sample
Bio Molecules
Cells
Ceramics
Data Storage
Other Hard Samples
Other Soft Sample
Polymers
Semiconductors
AFM Accessories
Shop by AFM
BioScope Catalyst
BioScope Resolve
Bioscope®
Caliber™
Dimension
EnviroScope™
For All AFMs
Innova™
MultiMode®
Shop by Accessory Type
Alignment Stands
Calibration References
Calibration Standards
Condensation Windows
Evaporation Covers
Fluid Cell Kits
Fluid Cells
MFM Tool Kits
Mounting Kits
O-Rings
Petri Dish Clamps
Piezo Guards
Probe Holders
Probe Storage Kits
Replacement Springs
Sample Holders
Splash Guards
Starter Kits
Test Samples
AFM Systems
Upgrades and Trade-Ins by AFM
Dimension Upgrade/ Trade-In
MultiMode Upgrade/ Trade-In
Quote Request
Blog
Support
AFM Probe FAQs
Bruker site
NanoScale World
Applications Selector Guide
About Bruker AFM Probes
Contact
Shopping Cart ( 0 )
Home
? Product
Easy Product
Wizard
Sample
Bio Molecules
Cells
Ceramics
Data Storage
Other Hard Samples
Other Soft Sample
Polymers
Semiconductors
Application
Holes/ Trenches
Electrical
Electrochemistry
Fluid Imaging
Mechanical Force Curves
Mechanical Property Mapping
Pulling
General Topography
Ultra Hi-Res
Mode
Conductive AFM (CAFM)
Contact Mode
Critical Dimension (CD) AFM
Electrical Spectroscopy
Electrostatic Force Microscopy (EFM)
Fast Scan
Force Modulation
Force Spectroscopy
HarmoniX
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
NanoIndentation
TappingMode/ Non-Contact
PeakForce QNM
PeakForce Tapping
PeakForce TUNA
Piezoresponse/ Piezoforce Microscopy (PFM)
ScanAsyst
Scanning Capacitance Mode (SCM)
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Spreading Resistance Mode (SSRM)
Nanoscale Thermal Analysis
Scanning Tunneling Microscopy (STM)
Surface Potential Microscopy (SPoM)
Torsional Resonance (TR)
Tunneling AFM (TUNA)
Deep Trench (DT)
Tip Enhanced Raman Spectroscopy (TERS)
Scanning Microwave Impedance Microscopy (sMIM)
FASTForce Volume
Contact Resonance
AFM
BioScope
BioScope Catalyst
BioScope Resolve
Caliber
Dimension Icon
Dimension FastScan
Dimension (Other)
EnviroScope
Innova
Insight
MultiMode
NEOS/ Senterra
Non-Bruker AFM
Vx and UVx
Resonant Frequency:
kHz
± 50kHz
± 100kHz
± 200kHz
Spring Constant:
N/m
± 0.05 N/m
± 0.1 N/m
± 5 N/m
± 10 N/m
± 15 N/m
and Greater
and Lower
Search Products
Clear selection
Featured Products
PEAKFORCE-HIRS-F-B
The world's first probe targeted at delivering high resolution on single biomolecules.- Ultra-shar
Details | Shop
MSCT-EXMT-BF1
Product Description:
Sharpened; 5 cantilevers 0.01-0.50N/m; Caliber mounted, Au Reflective Coating
Add To Cart
Model
Instrument
Mount
Pack Size
Price
Pack Quantity
MSCT-EXMT-BF1
Caliber/Explorer
Mounted
10
$435.00 (USD)
Quantity discounts available
Qty
Price/Pack
2-6
$391.50 (USD)
7-15
$369.75 (USD)
16-24
$348.00 (USD)
25-37
$326.25 (USD)
38+
$282.75 (USD)
Shape
Resonant Freq.
kHz
Spring Const.
N/m
Length
µm
Width
µm
Nom.
Min.
Max.
Nom.
Min.
Max.
Nom.
Min.
Max.
Nom.
Min.
Max.
B Rectangular
15
10
20
0.07
0.005
0.14
210
205
215
20
15
25
C Triangular
7
4
10
0.01
0.005
0.02
310
305
315
20
15
25
D Triangular
15
10
20
0.03
0.01
0.06
225
220
230
20
15
25
E Triangular
38
26
50
0.1
0.05
0.2
140
135
145
18
13
23
F Triangular
125
90
160
0.6
0.03
1.2
85
80
90
18
13
23
Tip Specification
Sharpened Microlevers. Cantilever B-F mounted for Caliber/Explorer SPMs.
Tip Schematic
Geometry:
Rotated (Symmetric)
Tip Height (h):
2.5 - 8.0
µm
Front Angle (FA):
15 ± 2.5
º
Back Angle (BA):
25 ± 2.5
º
Side Angle (SA):
17.5 ± 2.5
º
Tip Radius (Nom):
10
nm
Tip Radius (Max):
40
nm
Tip SetBack (TSB)(Nom):
4
µm
Tip Set Back (TSB)(RNG):
0 - 7
µm
Cantilever Specification
MSCT probes have less than 2deg of cantilever bend.
Cantilever schematic
Material:
Silicon Nitride
Geometry:
Rectangular & Triangular
Cantilevers Number:
5
Cantilever Thickness (Nom):
0.55
µm
Cantilever Thickness (RNG):
0.5 - 0.6
µm
Back Side Coating:
Reflective Gold
Top Layer Back:
45 ± 5 nm of Ti/Au
Optional Product Offerings
MSCT
Bruker's sharpened Microlever AFM probes have soft...
Details | Shop
MSCT-EXMT-A1
Sharpened; 0.05N/m; Caliber Mounted, Au Reflective...
Details | Shop
MLCT-EXMT-A1
A pack of Silicon Nitride Probes Premium Contact ...
Details | Shop
MLCT-EXMT-BF1
A pack of Silicon Nitride Probes Premium Contact ...
Details | Shop