***Note: The final day for ordering the TESP probe will be January 31st, 2015, after which point, it will become obsolete and replaced by the new model
TESP-V2. Please read the
TESP obsolescence notification letter here and
contact your local Bruker representative if you have any questions or concerns.
Bruker's premier line of etched silicon probes are the industry standard for imaging in TappingMode and non-contact mode in air. Tight specification control, unrivaled sensitivity, and dependably sharp tips all contribute to producing consistently accurate, high-resolution images.
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model
TESPA.
For a probe with similar specifications at a lower cost try the
NCHV probe, part of Bruker's new VALUE line!