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Resonant Frequency:
kHz
± 50kHz
± 100kHz
± 200kHz
Spring Constant:
N/m
± 0.05 N/m
± 0.1 N/m
± 5 N/m
± 10 N/m
± 15 N/m
and Greater
and Lower
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Clear selection
Featured Products
PEAKFORCE-HIRS-F-A
The world's first probe targeted at delivering high resolution on molecular lattices. - &nbs
Details | Shop
SCM-PIT
Product Description:
***Note: Bruker has launched an improved
SCM-PIT-V2
probe and recommends customers transition to this new probe model. The legacy SCM-PIT is no longer available.
Built on the high-performance
FESP
AFM probe, Bruker's SCM-PIT probe has a Platinum-Iridium coated, electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications. The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip. The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times.
AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using
PFTUNA
or
PFQNE-AL
probes.
Add To Cart
Model
Mount
Pack Size
Price
Pack Quantity
SCM-PIT
Unmounted
10
$450.00 (USD)
Quantity discounts available
Qty
Price/Pack
2-6
$382.50 (USD)
7-15
$337.50 (USD)
16-24
$292.50 (USD)
25-37
$247.50 (USD)
38+
$202.50 (USD)
Shape
Resonant Freq.
kHz
Spring Const.
N/m
Length
µm
Width
µm
Nom.
Min.
Max.
Nom.
Min.
Max.
Nom.
Min.
Max.
Nom.
Min.
Max.
Rectangular
75
50
100
2.8
1
5
225
200
250
28
23
33
Tip Specification
Tip Schematic
Geometry:
Standard (Steep)
Tip Height (h):
10 - 15
µm
Front Angle (FA):
25 ± 2.5
º
Back Angle (BA):
15 ± 2.5
º
Side Angle (SA):
22.5 ± 2.5
º
Tip Radius (Nom):
20
nm
Tip Radius (Max):
25
nm
Tip SetBack (TSB)(Nom):
15
µm
Tip Set Back (TSB)(RNG):
5 - 25
µm
Tip Coating:
Platinum-Iridium
Cantilever Specification
Cantilever schematic
Material:
0.01 - 0.025 Ocm Antimony (n) doped Si
Geometry:
Rectangular
Cantilevers Number:
1
Cantilever Thickness (Nom):
2.75
µm
Cantilever Thickness (RNG):
2.0 - 3.5
µm
Front Side Coating:
Conductive PtIr
Back Side Coating:
Reflective PtIr
Optional Product Offerings
SCM-PIT-V2
Bruker's new SCM-PIT-V2 probe replaces the legacy ...
Details | Shop
SCM-PIC-V2
***Note: Bruker's new SCM-PIC-V2 probe replaces th...
Details | Shop
PFQNE-AL
Bruker's new PeakForce KPFM probes, 10-pack. ...
Details | Shop
SCM-PTSI
Bruker SCM-PtSi Probes For the highest resoluti...
Details | Shop