***Note: Bruker has launched an improved
SCM-PIC-V2
probe and recommends customers transition to this new probe model. The
legacy SCM-PIC is still available while supplies last, at which point it will become obsolete.
Built on the high-performance
ESP AFM probe, Bruker's SCM-PIC probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications. The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip. The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times.
AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using
PFTUNA or
PFQNE-AL probes.