Sample

Application

Mode

AFM

Resonant Frequency:

kHz

Spring Constant:

N/m

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FASTSCAN-C

FastScan-C probes are designed specifically for imaging in fluid on the Dimension FastScan AFM.&nbs

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NP-10

Product Description:

A 10-pack of silicon nitride probes for contact and fluid tapping mode imaging and force measurement. 4 Cantilevers 0.06-0.35N/m; Au Reflective Coating

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Model	Instrument	Mount	Pack Size	Price	Pack Quantity
NP-10	All	Unmounted	10	$250.00 (USD)

Quantity discounts available

Qty	Price/Pack
2-6	$212.50 (USD)
7-15	$187.50 (USD)
16-24	$162.50 (USD)
25-37	$137.50 (USD)
38+	$125.00 (USD)

Shape	Resonant Freq. kHz			Spring Const. N/m			Length µm			Width µm
Shape	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.
A Triangular	65	50	80	0.35	0.175	0.7	120	125	115	25	20	30
B Triangular	23	16	28	0.12	0.06	0.24	205	200	210	40	35	45
C Triangular	56	40	75	0.24	0.12	0.48	120	115	125	20	15	25
D Triangular	18	12	24	0.06	0.03	0.12	205	200	210	25	20	30

Tip Specification

Tip Schematic

Geometry:	Rotated (Symmetric)
Tip Height (h):	2.5 - 8.0µm
Front Angle (FA):	15 ± 2.5º
Back Angle (BA):	25 ± 2.5º
Side Angle (SA):	17.5 ± 2.5º
Tip Radius (Nom):	20nm
Tip Radius (Max):	60nm
Tip SetBack (TSB)(Nom):	4µm
Tip Set Back (TSB)(RNG):	0 - 7µm

Cantilever Specification

Cantilever Orientation diagram can be found here.

DNP probes have less than 2deg of cantilever bend. The nominal stress specification for NP probes is less than 4deg of cantilever bend. For Bruker's Dimension SPMs, DNP is recommended.

Cantilever schematic

Material:	Silicon Nitride
Geometry:	Triangular
Cantilevers Number:	4
Cantilever Thickness (Nom):	0.6µm
Cantilever Thickness (RNG):	0.55 - 0.65µm
Back Side Coating:	Reflective Gold
Top Layer Back:	45 ± 5 nm of Ti/Au