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FIB1-100A
Geometry
RectangularTip Radius (nm)
Nom: 10
Max: 15
Frequency (KHz)
Nom: 320
Min: 230
Max: 410
Length (µm)
Nom: 125
Min: 110
Max: 140
Spring Const (N/m)
Nom: 42
Min: 20
Max: 80
Width (µm)
Nom: 40
Min: 30
Max: 50
Price: $1,050.00 (USD)
Sold in packs of 5
Questions? Free, Online Consulting
Overview
Bruker's Focused Ion Beam (FIB) line of probes are the industry standard silicon probe for deep trench measurement!
All FIB probes are based upon a ~320kHz, 40N/m cantilever for use in standard tapping mode on any AFM.
The FIB1-100A has an aspect ratio of 10:1, a 100nm wide spike at 1um from the tip apex. Aluminum reflective coating.
Tip Specification
High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 10:1 at 1um from tip apex.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 2 ± 0.5º
Back Angle (BA): 2 ± 0.5º
Side Angle (SA): 2 ± 0.5º
Cantilever Specification
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4µm
Cantilever Thickness (RNG): 3.25 - 4.75µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 45 ± 5nm of Al